Static Tester

Picoamp-resolution leakage measurement

Wide measuring range, one platform

Customer-specific multiplexer

Our high precision, flexible static testers are fully capable of operating in lab as well as a high volume production.

The tester measures every parameter against your limit values and flags any fail immediately, so faulty parts are caught and sorted out before the device leaves the line.

Single Diode Tester

Measures all parameters of single power diodes — contact check, Vz (temperature compensated), IR / DIR (temperature compensated), Vf (mA), Vf (Power) and dVf (ZHT). Available with a handling system: bunker, feeder, headwire straightener, cutting and length measurement, marking and good / waste sorting.

Contact check

Vz temp. compensated

IR / DIR temp. compensated

Vf (mA), Vf (Power)

many more....

FET Tester

Measures all parameters of FETs on the module — contact check, VSD diode, BVDSS, IDSS / DIDSS (forward/reverse) with leakage compensation, IGSS / DIGSS, VGSTH, RDSON, ZTH and ZTH loop, plus C and R. Includes integrated avalanche tests and integrates into a fully automated handling system.

Contact check

Vz temp. compensated

IR / DIR temp. compensated

Vf (mA), Vf (Power)

many more....

Rectifier Tester

Measures all parameters of the power diodes in a halfbridge / rectifier — contact check, Vz (temperature compensated), IR / DIR with leakage compensation, Vf (mA), chipfactor and dVf (loading). Fully automated or manual draw stations with an exchangeable adapter system, marking and good / waste differentiation.

Contact check

Vz temp. compensated

IR / DIR temp. compensated

Vf (mA), Vf (Power)

many more....

IGBT Tester

Measures all parameters of the IGBTs on the module up to 1000 A — contact check, VSD diode, VCE / VCESAT, ICES / DICES (forward/reverse) with leakage compensation, IGES / DIGES, VGSTH, ZTH and ZTH loop, plus C and R. Integrates into a fully automated handling system.

Contact check

Vz temp. compensated

IR / DIR temp. compensated

Vf (mA), Vf (Power)

many more....

Diode

FETs

IGBTs

Halfbridges / Rectifiers

Si/SiC KGD

Technical Features

Voltage range (low)

0 to ± 100 V @ ± 200 mA

Voltage range (high)

0 to ± 2000V @ ± 10mA

Highcurrent, uni/bidirectional

upto 1000A uni / bidirectional

Leakage current

1µA measuring range (Resolution of 33,33pA)

Sampling time

10 µs

Gate voltage

0 to ± 30 V

Software

Operating Software (KSR32 / KSR4) Application

Controls the hardware components of the tester Loads the measuring programs Performs the measurement process Handles other PC software, e.g., integrated scope function

Module Measuring Program Editor

Measuring programs are easy to change (save money and time) Measuring programs are compatible Exchangeable between tester

Integrated Oscilloscope

Display of the measurement data with zoom and editing function for ideal measurement data analysis.

Gallery

Lifecycle services

Autocal

Empowering you to independently verify DC specifications and perform automated calibration, ensuring your tester maintains peak accuracy over its lifetime.

Software

KSR operating software and MMP editors provide a flexible architecture to easily adapt measuring programs, control hardware, and analyze production data

Onsite

Comprehensive support and regular on-site maintenance from our expert technical team to guarantee long-term reliability and keep your lines running optimally. Installation, commissioning and service at your production site, anywhere in the world.

Trainings

Expert-led training programs designed to equip your team with the essential skills for system operation, routine maintenance, and advanced testing execution.

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