Static Tester

pA resolution leakage measurement

ZTH / RTH included as standard

Customer-specific multiplexer

Our flexible static testers provide high precision measurement with ZTH/RTH as a standard

Static tester measures every parameter against your limit values and flags any fail immediately, so faulty parts are caught and sorted out before the device leaves the line.

IGBT Tester

Measures all parameters of the IGBTs on the module by using a multiplexer.

- Contact check
- VSD diode
- VCE / VCE_SAT
- I_CES / DI_CES (forward/reverse) with leakage compensation
- I_GES / DI_GES
- VGS_TH
- ZTH and ZTH loop
- Capacitance
- Resistance
. . . .

Available with a simple lab handling system and it can be integrated into a fully automated handling system.

FET Tester

Measures all parameters of Si / SiC / GaN based FET chips or modules by using a multiplexer.

- Contact check
- VSD diode
- BV_DSS
- I_DSS / DI_DSS (forward/reverse) with leakage compensation
- I_GSS / DI_GSS
- VGS_TH
- RDS_ON
- ZTH and ZTH loop
- Capacitance & Resistance
- Integrated double pulse and avalanche test for low voltage chips
. . . .

Available with a simple lab handling system and it can be integrated into a fully automated handling system.

Single Diode Tester

Measures all parameters of single power diodes

- Contact check
- Vz (temperature compensated)
- IR / DIR with leakage and temperature compensation
- Vf (mA), Vf (Power)
- dVf (ZTH)
. . . .

Available with a handling system: bunker, feeder, headwire straightener, cutting and length measurement, marking and good / waste sorting.

Rectifier Tester

Measures all parameters of the power diodes using a multiplexer for a faster cycle time and reliable measuring

- Contact check
- Vz (temperature compensated)
- IR / DIR with leakage and temperature compensation
- Vf (mA)
- Chipfactor
- dVf (loading) tested in parallel

. . . .

Fully automated or manual draw stations with an exchangeable test adapter for different devices, marking and good / waste differentiation.

Diode

Z Diodes / High Voltage Diodes / ULLD / ARD ...

FET

Si / SiC / GaN

IGBT

Silicon (Si)

Bridges / Modules

Half Bridge, Full Bridge and Rectifiers

Die (KGD)

Si / SiC / GaN

Technical Details

These represent our standard specifications. We offer customer specific modifications to meet your exact testing requirements.

Range Resolution

Voltage

200 mV 6,7 µV

2 V / 5 V 66,7 µV / 166,7 µV

100 V 3,3 mV

1000 V / 3000 V 33,3 mV / 100 mV

Current

100 nA 3,3 pA

10 µA 333,3 pA

200 µA / 1 mA 6,7 nA / 33,3 nA

100 mA / 200 mA 3,3 µA / 6,7 µA

20 A / 200 A 6,67 mA / 6,7 mA

200 A / 1000 A 6,7 mA / 33,3 mA

Power Pulses

5 / 80 V up to 1000 A @ 500 µs to 1s

Sampling time

10 µs

Gate Voltage

0 V to ±30 V

Software

Operating Software

Controls the tester hardware (SMU's) Loads the measuring programs Runs the measurement process Handles other apps, e.g., integrated scope function

Module Measuring Program Editor

Measuring programs are easy to change, compatible and exchangeable between testers. Fully set of measuring programs is provided with the testers.

Integrated Oscilloscope

Display of the measurement data with zoom and editing function for ideal measurement data analysis.

Data Management & Traceability

Complete traceability of every Device Under Test Flexible data export functions Customer-specific database schemas Integration with existing customer databases