Very low stray inductance
High power and time resolution
Built-in DUT protection
Our high precision, flexible dynamic testers are fully capable of operating in lab as well as a high volume production.
The tester checks each pulse, if the voltage, current and power levels are reached, and flags any error immediately so faults can be caught before the device leaves the line.
1 / 2
Tester Cabinet
Controls the measurement unit and logs data at the highest possible resolution, with oscilloscopes for analysing du/dt, di/dt, switching times, clamping and peak voltages, collector current and gate voltage. Complete traceability of every DUT, with data saved to databases and uploaded to your network.
Contact check
Vz temp. compensated
IR / DIR temp. compensated
Vf (mA), Vf (Power)
many more....
Diode
FETs
IGBTs
Halfbridges / Rectifiers
Si/SiC KGD
Technical Features
Maximum Voltage
1500 V
Maximum current (RBSOA)
4000 A
Maximum current (SCSOA)
12000 A
Pulse
≥ 1 µs in 25 ns pitch
(1 µs … 500 µs, 100 ns steps)
Gate voltage
−30 V to +30 V
(programmable)
Low inductivity
22 nH
in a high-volume production line
Software
Operating Software (KSR32 / KSR4) Application
Controls the hardware components of the tester Loads the measuring programs Performs the measurement process Handles other PC software, e.g., integrated scope function
Module Measuring Program Editor
Measuring programs are easy to change (save money and time) Measuring programs are compatible Exchangeable between tester
Integrated Oscilloscope
Display of the measurement data with zoom and editing function for ideal measurement data analysis.
Gallery
Lifecycle services
Autocal
Software
Onsite
Trainings
Planning your next semiconductor tester?
Talk to our experts for professional guidance.