Testers

Static Testers

Record every electrical parameter under load — contact check, forward and breakdown voltage, leakage currents with compensation, RDSON / VCESAT, threshold voltage and thermal impedance. For FET and IGBT modules, single power diodes and halfbridges / rectifiers, up to 1000 A.

Up to ± 2000 V and 1000 A, with leakage current down to the 1 µA range (33.33 pA resolution)

FET / IGBT, single power diode and halfbridge / rectifier variants

Run standalone or fully integrated into an automated handling line

ZTH RTH Included in Static Tester

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Dynamic Testers

Double pulse tests (RBSOA) and short circuit tests (SCSOA) that prove the switching performance and durability of IGBT modules in Si, SiC and GaN. Run them at room temperature or maximum temperature, in the laboratory or fully inline in production.

Up to 1500 V / 4000 A RBSOA and 1500 V / 12000 A SCSOA

Pulses ≥ 1 µs in 25 ns pitch, with very low stray inductance (e.g. 22 nH inline)

Laboratory cabinet or fully automated inline shift-operation

Fast exchangable measuring unit

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Under Construction

Inverter Testers

Inverter-level test solutions are currently in development. Talk to us early about your application, target parameters and volumes, and we will help you scope the right approach — and keep you informed as this product line becomes available.

Custom Solutions

Tailor-made systems for special test procedures — HTRB, HTOL, ZTH and thermal cycling. When a standard machine does not fit your device, we design the system around your specification, parameters and throughput for continuous quality control under extreme conditions.

HTRB up to ± 6500 V at 200 °C; HTOL to JEDEC standards up to 260 °C

ZTH and thermal-cycling systems for continuous quality control

Built around your device, your parameters and your line

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