Designed around your device
Built for extreme conditions*
Long, autonomous test runs
Our high precision, flexible custom solutions are fully capable of operating in lab as well as a high volume production.
Each custom system is engineered to your exact specifications — voltage ranges, current levels, device types, and production throughput — with full lifecycle support included.
Tester Cabinet
A low-volume production-line ZTH system at 150 A, measuring all parameters of a FET or FET module — contact check, BVDSS, IDSS / DIDSS with compensation, IGSS / DIGSS, VGSTH, RDSON, ZTH and ZTH loop, C and R — and including a manual contacting station.
HTRB Tester
High Temperature Reverse Bias testing for up to 4 DUTs at ± 6500 V and 200 °C. Runs 72 h independently of the PC, with high-voltage supplies, four temperature regulators, separate heating and cooling per DUT, and a dedicated safety system.
HTOL Tester
High Temperature Operating Life testing to JEDEC standards over 100–1000 h. Up to 80 DUTs in a heating chamber to 260 °C, with high-power supplies, an oscilloscope, a multiplexer for V-measurement and current limitation per DUT.
Thermal Cycling Diode Tester
Stress-tests rectifier diodes with high-current pulses up to 200 A while monitoring forward voltage to track junction temperature. 16 independent positions run 500+ hours, with programmable cycle patterns and per-product contact units.
and many more...
as per your requirements.
Diode
FETs
IGBTs
Halfbridges / Rectifiers
Si/SiC KGD
Lifecycle services
Autocal
Software
Onsite
Trainings
Planning your next semiconductor tester?
Talk to our experts for professional guidance.